The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 08, 2008
Filed:
Jun. 07, 2004
Applicants:
Takahiro Yamaguchi, Tokyo, JP;
Masahiro Ishida, Tokyo, JP;
Mani Soma, Seattle, WA (US);
Inventors:
Assignee:
Advantest Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01); G01R 13/00 (2006.01); G10L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A wideband signal analyzing apparatus for analyzing an input signal includes frequency-shifting means for generating a plurality of intermediate frequency signals by shifting a frequency of the input signal as much as respectively different frequency-shifting amounts, so that if a frequency band of the input signal is divided into a plurality of frequency bands, each of the frequency bands can be shifted to a predetermined intermediate band, spectrum measuring means for outputting a complex spectrum of each of the intermediate frequency signals, and spectrum reconstructing means for merging the complex spectra.