The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 01, 2008
Filed:
Jul. 28, 2004
Greg L. Archer, Rochester, NY (US);
Eric J. Meisenzahl, Ontario, NY (US);
Dennis J. Vankerkhove, Rochester, NY (US);
Greg L. Archer, Rochester, NY (US);
Eric J. Meisenzahl, Ontario, NY (US);
Dennis J. Vankerkhove, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method for testing an image sensor for photoresponse uniformity, the method includes the steps of providing a light source having inherent non-uniform light intensity characteristics; providing a light sensing device for measuring an intensity response of the light source on a predetermined image plane; determining an area on the image plane corresponding to an area for the image sensor; measuring pre-selected points of the determined area by the light sensing device for measuring incident light intensity from the light source on the image plane; interpolating non-measured points on the image plane representing an estimate of the non-uniformity of the light source at the non-measured points; inverting the interpolated image to represent the inverse of the light source non-uniformity; and applying the inverted image to the response of the image sensor which compensates for light source non-uniformity and enables the ability to quantify accurately the non-uniformity of the image sensor.