The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Dec. 27, 2004
Applicant:

Ken G. Purchase, Mountain View, CA (US);

Inventor:

Ken G. Purchase, Mountain View, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are a method, system, and device for passing a plurality of light beams though an array of waveguides wherein at least one waveguide is coupled to a test structure which exhibits an insertion loss dependent on a known polarization. For each of a plurality of adjacent waveguides of the array including the one waveguide, a first wavelength response associated with a first polarization, and a second wavelength response associated with a second polarization, may be measured. In one example, polarization may be identified as the known polarization if the peak value of one wavelength response of the test structure is less than the peak value of another wavelength response of the first test structure. In one embodiment, unknown polarizations in the polarization response of an optical component having multiple correlated outputs may be identified. Other embodiments are described and claimed.


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