The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 25, 2007

Filed:

Jun. 22, 2004
Applicants:

Richard Dempster, Manhattan, KS (US);

Maureen Olewnik, Manhattan, KS (US);

Virgil S. Smail, Manhattan, KS (US);

Inventors:

Richard Dempster, Manhattan, KS (US);

Maureen Olewnik, Manhattan, KS (US);

Virgil S. Smail, Manhattan, KS (US);

Assignee:

American Institute of Baking, Manhattan, KS (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Improved techniques for estimating dough development times are provided in order to permit rapid and accurate forecasts of dough development times in commercial baking operations with different lots of wheat flour. The method of the invention involves directing near infrared radiation against a dough formulation during mixing thereof, and collecting a plurality of time-dependant absorbance spectra; the spectral data are then analyzed, preferably by calculating magnitude ratios at predetermined spectral absorbances, and then estimating the dough development time as a function of the magnitude ratios.


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