The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Apr. 10, 2003
Salih Burak Gokturk, Mountain View, CA (US);
Carlo Tomasi, Palo Alto, CA (US);
Fahri Sürücü, San Jose, CA (US);
Salih Burak Gokturk, Mountain View, CA (US);
Carlo Tomasi, Palo Alto, CA (US);
Fahri Sürücü, San Jose, CA (US);
Canesta, Inc., Sunnyvale, CA (US);
Abstract
A class of measurement devices can be made available using a family of projection patterns and image processing and computer vision algorithms. The proposed system involves a camera system, one or more structured light source, or a special pattern that is already drawn on the object under measurement. The camera system uses computer vision and image processing techniques to measure the real length of the projected pattern. The method can be extended to measure the volumes of boxes, or angles on planar surfaces.