The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 18, 2007
Filed:
Mar. 28, 2003
Touichirou Takai, Nonoichi-machi, JP;
Misao Tomita, Nonoichi-machi, JP;
Hideaki Kawahara, Nonoichi-machi, JP;
Tooru Awazu, Nonoichi-machi, JP;
Makoto Diou, Nonoichi-machi, JP;
Taku Kitaura, Nonoichi-machi, JP;
Kazuo Hosotani, Nonoichi-machi, JP;
Ikuo Togashi, Nonoichi-machi, JP;
Masato Nishi, Nonoichi-machi, JP;
Motonari Amano, Nonoichi-machi, JP;
Takahiro Matsuura, Nonoichi-machi, JP;
Touichirou Takai, Nonoichi-machi, JP;
Misao Tomita, Nonoichi-machi, JP;
Hideaki Kawahara, Nonoichi-machi, JP;
Tooru Awazu, Nonoichi-machi, JP;
Makoto Diou, Nonoichi-machi, JP;
Taku Kitaura, Nonoichi-machi, JP;
Kazuo Hosotani, Nonoichi-machi, JP;
Ikuo Togashi, Nonoichi-machi, JP;
Masato Nishi, Nonoichi-machi, JP;
Motonari Amano, Nonoichi-machi, JP;
Takahiro Matsuura, Nonoichi-machi, JP;
Takai Tofu & Soymilk Equipment Company Limited, Ishikawa-Gun, JP;
Matsuuradenkosha Company Limited, Ishikawa-ku, JP;
Abstract
A system and method for evaluating a material body by a scattered light observation system which observes a gel state or a gel-formable sol state material body illuminated with a coherent light through a two dimensional image recognizing means, including measuring a gel state or a change in sol-gel state of said material body using a light section formed on an image forming surface or conditions of a speckle pattern.