The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 04, 2007
Filed:
Dec. 01, 2006
K. Reed Gleason, Portland, OR (US);
Tim Lesher, Portland, OR (US);
Eric W. Strid, Portland, OR (US);
Mike Andrews, Cornelius, OR (US);
John Martin, Portland, OR (US);
John Dunklee, Tigard, OR (US);
Leonard Hayden, Beaverton, OR (US);
Amr M. E. Safwat, Cairo, EG;
K. Reed Gleason, Portland, OR (US);
Tim Lesher, Portland, OR (US);
Eric W. Strid, Portland, OR (US);
Mike Andrews, Cornelius, OR (US);
John Martin, Portland, OR (US);
John Dunklee, Tigard, OR (US);
Leonard Hayden, Beaverton, OR (US);
Amr M. E. Safwat, Cairo, EG;
Cascade Microtech, Inc., Beaverton, OR (US);
Abstract
A shielded probe for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies. The probe may include a probe tip that extends through a dielectric substrate that supports on a first surface a signal path to test instrumentation and on a second surface a ground path that shields both the signal path and the probe tip.