The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Feb. 25, 2003
Eric Adler, Jericho, VT (US);
Serge Biesemans, Mount Kisco, NY (US);
Micah S. Galland, Essex Junction, VT (US);
Terence B. Hook, Jericho, VT (US);
Judith H. Mccullen, Essex Junction, VT (US);
Eric S. Phipps, Winston-Salem, NC (US);
James A. Slinkman, Montpelier, VT (US);
Eric Adler, Jericho, VT (US);
Serge Biesemans, Mount Kisco, NY (US);
Micah S. Galland, Essex Junction, VT (US);
Terence B. Hook, Jericho, VT (US);
Judith H. McCullen, Essex Junction, VT (US);
Eric S. Phipps, Winston-Salem, NC (US);
James A. Slinkman, Montpelier, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method for calibrating a software model for a given structure of interest for a variable imposed by an adjacent structure. First determine the spatial extent of the variable imposed by the adjacent structure. Then assign a value to the spatial extent, which varies as a function of distance from the adjacent structure to the given structure. Finally, attach that value to the model of the given structure.