The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 27, 2007

Filed:

Jan. 26, 2005
Applicants:

Eiichi Yanagi, Tokyo, JP;

Shinichi Nakamura, Tokyo, JP;

Inventors:

Eiichi Yanagi, Tokyo, JP;

Shinichi Nakamura, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/00 (2006.01); A61B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A lens-refracting characteristic measuring apparatus includes a measuring optical device to measure refracting characteristics of eyeglass lenses, an input device to input a pupillary distance of eyes of a person wearing eyeglasses, and an arithmetic and control circuit for obtaining refracting characteristics of the eyeglass lenses in positions of centers of right and left pupils of the person wearing the eyeglasses based on the pupillary distance of right and left eyes of the person wearing the eyeglasses input by the input device and the refracting characteristics measured by the measuring optical device.


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