The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 27, 2007
Filed:
Oct. 22, 2004
Applicants:
Jovan Jovanovic, Santa Clara, CA (US);
Frank O. Uher, Los Altos, CA (US);
Donald P. Richmond, Ii, Palo Alto, CA (US);
Inventors:
Jovan Jovanovic, Santa Clara, CA (US);
Frank O. Uher, Los Altos, CA (US);
Donald P. Richmond, II, Palo Alto, CA (US);
Assignee:
Aehr Test Systems, Fremont, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of assembling a test contactor is described. The method includes aligning an interposer and an electrical contactor wherein resilient interconnection elements of the interposer are resiliently deformed into a deformed state to make electrical contact with corresponding electrical terminals on the electrical contactor; and securing the interposer and the electrical contactor together to lock the resilient interconnection elements in said deformed state.