The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 20, 2007
Filed:
Dec. 03, 2002
Hiroshi Okuda, Tokyo, JP;
Toshiyuki Kiyokawa, Tokyo, JP;
Haruki Nakajima, Tokyo, JP;
ADVANTEST Corporation, Tokyo, JP;
Abstract
A holding side contact arm () for holding an IC to be tested is positioned on the optical axis (OP) of an alignment CCD camera () of an alignment device (), the IC to be tested is inserted to a first opening () formed on an alignment movable portion (), and a contact member () of the holding side contact arm () is brought to contact the alignment movable portion (). Then, an alignment amount for correcting a position of the IC to be tested is calculated by taking an image by the camera () and performing image processing. A lock-and-free means () provided to a first contact arm () is made to be in a non-restricted state, a movable portion driving device () is driven based on the alignment amount, and the holding side contact arm () contacting the alignment movable portion () is moved with respect to a root side contact arm (), so that alignment of a position of the IC to be tested is performed.