The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 13, 2007
Filed:
Sep. 18, 2006
Joachim Lange, Hagenbach, DE;
Rolf-dieter Schipper, Karlsruhe, DE;
Joachim Lange, Hagenbach, DE;
Rolf-Dieter Schipper, Karlsruhe, DE;
Bruker AXS GmbH, Karlsruhe, DE;
Abstract
A method for operating an X-ray or neutron-optical system and beam stop comprising an X-ray or neutron source () from which corresponding radiation is guided as a primary beam () to a sample () under investigation, with an X-ray or neutron detector () for receiving radiation diffracted or scattered from the sample (), wherein the source (), the sample and the detector are disposed substantially on one line (=z-axis) and wherein a beam stop () is provided between the sample and the detector whose cross-sectional shape is adjusted to the cross-section of the primary beam is characterized in that the beam stop is disposed to be displaceable along the z-direction for optimum adjustment of the amounts of useful and interfering radiation impinging on the detector. This protects the detector from the influence of the primary beam while allowing a maximum amount of diffracted or scattered radiation to reach the detector, wherein the beam stop can be easily adjusted to temporally changing properties of the beam optics.