The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 30, 2007
Filed:
Mar. 28, 2005
Applicants:
Zhengrong Zhou, Santa Rosa, CA (US);
Yi Xu, Santa Rosa, CA (US);
Kai Yick, Elk Grove, CA (US);
Inventors:
Assignee:
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
In one embodiment, a selection of plural testflows is first obtained. Each testflow specifies how automated test equipment (ATE) should test at least one device. Calibration information is then identified for each of the testflows, and redundancies in the identified calibration information are eliminated to compile a set of non-redundant information for performing a focused calibration over the ATE and selected testflows.