The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7288447 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 30, 2007

Filed:

Jan. 18, 2005
Applicants:

Jian Chen, Austin, TX (US);

Thien T. Nguyen, Austin, TX (US);

Michael D. Turner, San Antonio, TX (US);

James E. Vasek, Austin, TX (US);

Inventors:

Jian Chen, Austin, TX (US);

Thien T. Nguyen, Austin, TX (US);

Michael D. Turner, San Antonio, TX (US);

James E. Vasek, Austin, TX (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device has trenches for defining active regions. After a thin diffusion barrier is deposited in the trenches, some of the trenches are selectively etched to leave different areas in the trench. One of the areas has the diffusion barrier completely removed so that the underlying layer is exposed. Another area has the diffusion barrier remaining. An oxidation step follows so that oxidation occurs at a corner where the diffusion barrier was removed whereas the oxidation is blocked by the diffusion barrier, which functions as a barrier to oxygen. The corners for oxidation are those in which compressive stress is desirable, such as along a portion of the border of a P channel transistor. The corners where the diffusion barrier is left are those in which a compressive stress is undesirable such as the border of an N channel transistor.


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