The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Nov. 15, 2005
Applicants:

John K. Schneider, Snyder, NY (US);

Fred W. Kiefer, Clarence, NY (US);

James T. Baker, Lockport, NY (US);

Inventors:

John K. Schneider, Snyder, NY (US);

Fred W. Kiefer, Clarence, NY (US);

James T. Baker, Lockport, NY (US);

Assignee:

Ultra-Scan Corporation, Amherst, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/66 (2006.01); G06N 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention includes a method of deciding whether a data set is acceptable for making a decision. A first probability partition array and a second probability partition array may be provided. A no-match zone may be established and used to calculate a false-acceptance-rate ('FAR') and/or a false-rejection-rate ('FRR') for the data set. The FAR and/or the FAR may be compared to desired rates. Based on the comparison, the data set may be either accepted or rejected. The invention may also be embodied as a computer readable memory device for executing the methods.


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