The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Jul. 12, 2005
Satoshi Ozora, Tokyo, JP;
Tetsuro Nakagawa, Tokyo, JP;
Makoto Tsunoda, Tokyo, JP;
Nobumasa Takaiwa, Tokyo, JP;
Satoshi Ozora, Tokyo, JP;
Tetsuro Nakagawa, Tokyo, JP;
Makoto Tsunoda, Tokyo, JP;
Nobumasa Takaiwa, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
There is provided a testing device including: a first signal comparator operable to acquire a value of an output pattern based on a result that is obtained by comparing a voltage of an output signal and a first threshold value voltage in a first strobe timing, in order to acquire a first output pattern sequence; a second signal comparator operable to acquire a value of an output pattern based on a result that is obtained by comparing a voltage of an output signal and a second threshold value voltage in a second strobe timing, in order to acquire a second output pattern sequence; a header pattern sequence detecting unit operable to detect that the first output pattern sequence is identical with a header pattern sequence; and an expectation comparing unit operable to output a comparison result between the second output pattern sequence acquired by the second signal comparator and an expectation pattern sequence when detecting a correspondence between the first output pattern sequence and the header pattern sequence.