The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Feb. 22, 2005
Charles N. Archie, Granite Springs, NY (US);
G. William Banke, Jr., Essex Junction, VT (US);
Matthew J. Sendelbach, Fishkill, NY (US);
Charles N. Archie, Granite Springs, NY (US);
G. William Banke, Jr., Essex Junction, VT (US);
Matthew J. Sendelbach, Fishkill, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Methods and related program product for assessing and optimizing metrology instruments by determining a total measurement uncertainty (TMU) based on precision and accuracy. The TMU is calculated based on a linear regression analysis and removing a reference measuring system uncertainty (U) from a net residual error. The TMU provides an objective and more accurate representation of whether a measurement system under test has an ability to sense true product variation. The invention also includes a method for determining an uncertainty of the TMU.