The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 23, 2007

Filed:

Dec. 12, 2006
Applicant:

Takeharu Matsuda, Nara-ken, JP;

Inventor:

Takeharu Matsuda, Nara-ken, JP;

Assignee:

Takatori Corporation, Nara-ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B28D 1/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a cutting method by a wire saw, in which a wire A at a wire array wound around work rollersis made to reciprocate or travel in one direction at a high speed and numerous pieces of wafers are cut out in abutment of a workpiece B against the wire array, a receiving memberof a cassette type having numerous support wiresarranged at the same pitch as that of the wire at the wire array is disposed at a position immediately under the wire array for cutting the workpiece B; and wafers b cut out of the workpiece B by the wire A are contained in separation one from another between the support wiresin the receiving member. Thus, the wafers can be prevented from adhering to each other during a cutting operation, thus to be accurately cut, and further, the wafers can be prevented from being cracked during the cutting operation, thus to be efficiently separated one from another, so as to enhance wafer cleansing performance.


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