The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2007
Filed:
Jul. 12, 2006
Yasuyuki Nozuyama, Inashiro, JP;
Yasuyuki Nozuyama, Inashiro, JP;
Kabushiki Kaisha Toshiba, Minato-ku, Tokyo, JP;
Abstract
A fault on a measuring point and information about a driving circuit of the fault are extracted. A signal value of a portion related to the fault on the measuring point and an input value of the driving circuit of the portion are obtained when a fault is not included. A fault candidate is extracted from detected faults based on a difference between a measured IDDQ value and a measured estimated IDDQ value when the fault is not included. An estimated calculation value to be a difference of an IDDQ value is calculated between a case when each of the faults is included and a case when the fault is not included. The estimated calculation value is compared with a difference between the measured value and the measured estimation value to decide whether or not the fault candidate is the fault corresponding to a defective portion.