The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Jun. 12, 2003
Win-harn Liu, Taipei, TW;
Jeff Song, Taipei, TW;
Yue Sun, Tianjin, CN;
Inventec Corporation, Taipei, TW;
Abstract
A test system and method utilizing a single storage device through a network, which includes a server and at least a test object connected to a storage device that supports multi-system operations. The storage device provides many kinds of test environments and test tools for different test objects. The storage device includes a test program, a plurality of virtual test sections and test tools. When a correspondent virtual test section does not exist in the storage device, the associated test disk image is obtained from the server for establishing a new virtual test section in the storage device. Through the network operation, the test environment management is simplified and the test efficiency is improved.