The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Jan. 26, 2005
Eiichi Yanagi, Tokyo, JP;
Shinichi Nakamura, Tokyo, JP;
Eiichi Yanagi, Tokyo, JP;
Shinichi Nakamura, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
A lens meter that measures optical characteristics of lenses of an eyeglass unit and an inspection glass unit, including a glass unit support, light sources, light-projecting and -detecting optical systems, light detectors, and inspection glass frame adaptors for the inspection glass unit. The support includes two sandwiching members displaceable to sandwich an outer peripheral portion of the eyeglass unit, and the adaptors can be fitted to and detached from the sandwiching members. The adaptors include projecting sandwiching portions projecting toward opposite sandwiching members when the adaptors are fitted to the sandwiching members and which contact portions of the inspection glass unit's frame, other than movable areas of tabs of detachable lenses projecting from a frame of an inspection glass lens unit supported by the support as the eyeglass unit, whereas adaptor portions other than the projecting sandwiching portions do not interfere with the movable areas of the tabs.