The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 09, 2007
Filed:
Jan. 14, 2005
Erik H. Volkerink, San Jose, CA (US);
Klaus Dieter Hilliges, Mountain View, CA (US);
Edmundo DE LA Puente, Cupertino, CA (US);
Erik H. Volkerink, San Jose, CA (US);
Klaus Dieter Hilliges, Mountain View, CA (US);
Edmundo De La Puente, Cupertino, CA (US);
Verigy (Singapore) Pte. Ltd., Singapore, SG;
Abstract
Systems and methods of allocating device testing resources are described. In one aspect, a system for allocating m resources for testing devices to n sites of a probe card configured to electrically connect to respective test site locations on a substrate, where m and n are integers and m<n, is described. The system includes a configurable interconnection network that includes a plurality of connections between resources and the probe card sites. The connections enable each test site location to be connected to at least one of the resources over a minimum number of touchdowns of the probe card onto the test sites. Each of the resources is connectable to at most a number of the probe card sites equal to the minimum number of touchdowns. A method of allocating m resources for testing devices to n sites of a probe card configured to electrically connect to respective test site locations on a substrate, where m and n are integers and m<n, also is described.