The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 09, 2007

Filed:

Aug. 25, 2005
Applicants:

Scott R. Williams, Saint George, UT (US);

John M. Shuhart, Warminster, PA (US);

Alan Slopey, Warrington, PA (US);

Guy B. Frick, Maple Glen, PA (US);

Inventors:

Scott R. Williams, Saint George, UT (US);

John M. Shuhart, Warminster, PA (US);

Alan Slopey, Warrington, PA (US);

Guy B. Frick, Maple Glen, PA (US);

Assignee:

SV Probe Pte Ltd., Singapore, SG;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe for a probe card assembly is provided. The probe includes a beam element having a tip end portion. The probe also includes a tip structure on the tip end portion of the beam element. The tip structure includes a plurality of conductive bumps arranged in a stacked configuration.


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