The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 02, 2007
Filed:
Nov. 15, 2005
Masayoshi Takahashi, Yokohama, JP;
Masami Makuuchi, Yokohama, JP;
Ritsuro Orihashi, Tokyo, JP;
Shinji Homma, Nakai, JP;
Masayoshi Takahashi, Yokohama, JP;
Masami Makuuchi, Yokohama, JP;
Ritsuro Orihashi, Tokyo, JP;
Shinji Homma, Nakai, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A magnetic characteristic inspecting apparatus including a plurality of disk rotating devices or a plurality of magnetic heads include a unit for switching output signals of write signal production units or allocating the output signals to the magnetic heads, a unit for switching signals read from the magnetic heads or allocating the read signals to measurement resources, and a unit for selecting any of the disk rotating devices synchronously with which the measurement resources will perform measurement. The write signal production units and measurement resources are shared among inspections of the plurality of disk rotating devices or the plurality of heads.