The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 25, 2007

Filed:

Jun. 30, 2005
Applicants:

Serafino Bueti, Waterbury, VT (US);

Adam J. Courchesne, Belchertown, MA (US);

Kenneth J. Goodnow, Essex, VT (US);

Jason M. Norman, Essex Junction, VT (US);

Stanley B. Stanski, Essex Junction, VT (US);

Scott T. Vento, Essex Junction, VT (US);

Inventors:

Serafino Bueti, Waterbury, VT (US);

Adam J. Courchesne, Belchertown, MA (US);

Kenneth J. Goodnow, Essex, VT (US);

Jason M. Norman, Essex Junction, VT (US);

Stanley B. Stanski, Essex Junction, VT (US);

Scott T. Vento, Essex Junction, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 7/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for monitoring the temperature of an integrated circuit device includes a conductive wiring pattern formed on the integrated circuit device, extending into areas of the device to be monitored. A deterministic signal source is configured to generate a deterministic signal along the conductive wiring pattern, with one or more return paths tapped from selected locations along the pattern. A temperature change determination circuit is coupled to the one or more return paths and to a reference signal taken from the deterministic signal source. The circuit is configured to determine a delay between the reference signal and a delay signal traveling through at least a portion of the wiring pattern and a corresponding one of the return paths.


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