The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 25, 2007
Filed:
Dec. 21, 2004
Takuya Hayahi, Naka-gun, JP;
Fumio Tsushima, Naka-gun, JP;
Takatoshi Oshika, Naka-gun, JP;
Mitsubishi Materials Corporation, Tokyo, JP;
Abstract
There is provided a surface-coated cermet cutting tool with a hard-coating layer having excellent chipping resistance. The surface-coated cermet cutting tool is formed by coating, on a surface of a tool substrate made of WC-based cemented carbide or TiCN-based cermet, a hard-coating layer including the following upper and lower layers (a) and (b): (a) as the lower layer, a Ti compound layer having at least one or two of a TiC layer, a TiN layer, a TiCN layer, a TiCO layer and a TiCNO layer, all of which are deposited by chemical vapor deposition, the titanium compound layer having a total average thickness of 3 to 20 μm, and (b) as the upper layer, a heat-transformed α-type Al oxide layer formed by carrying out a heat-transforming treatment in a state that titanium oxide particulates satisfying the composition formula: TiO, (where value Y is 1.2 to 1.9 in an atomic ratio to Ti when measured by Auger Electron Spectroscopy) and chemically deposited as a transformation starting material are dispersedly distributed on a surface of an Al oxide layer having a κ-type or θ-type crystal structure deposited by chemical vapor deposition and satisfying the composition formula: (AlZr)O(where value X is 0.003 to 0.05 in an atomic ratio when measured by an electron probe micro-analyzer (EPMA)) to thereby transform the crystal structure of the Al oxide layer having the κ-type or θ-type crystal structure into an α-type crystal structure, the heat-transformed α-type Al oxide layer having an average thickness of 1 to 15 μm.