The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Sep. 23, 2002
Applicants:

David A. Holaday, Cornelius, OR (US);

Gary K. Richmond, Beaverton, OR (US);

Donald C. Kirkpatrick, Beaverton, OR (US);

Inventors:

David A. Holaday, Cornelius, OR (US);

Gary K. Richmond, Beaverton, OR (US);

Donald C. Kirkpatrick, Beaverton, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test and measurement instrument such as a Logic Analyzer, or the like, has at least one Reloadable Word Recognizer whose reference value can be loaded by a trigger machine with a current acquired data sample while data is being acquired. In a second embodiment useful for performing memory testing, the reloadable word recognizer is used in cooperation with two conventional word recognizers. In a third embodiment, a delay unit is employed to provide delayed input data words as reference words. In a fourth embodiment, an offset register and adder are used to modify the input data words before storing them. A fifth embodiment provides for substantially immediate use of base addresses of relocatable subroutines and stack-based variables recovered from a data stream acquired from a system under test.


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