The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2007
Filed:
Aug. 21, 2003
Franz Cemic, Weilmünster, DE;
Lambert Danner, Wetzlar-Naunheim, DE;
Uwe Graf, Solms, DE;
Robert Mainberger, Braunfels, DE;
Dirk Sönksen, Schöffengrund, DE;
Volker Knorz, Hüttenberg, DE;
Franz Cemic, Weilmünster, DE;
Lambert Danner, Wetzlar-Naunheim, DE;
Uwe Graf, Solms, DE;
Robert Mainberger, Braunfels, DE;
Dirk Sönksen, Schöffengrund, DE;
Volker Knorz, Hüttenberg, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A device and method for inspecting an object () uses a bright field illumination beam path () of a bright field light source (), said beam path being formed so that it passes through the projection optics (), and a dark field illumination beam path () of a dark field light source (), this beam path being formed so that it also passes through the projection optics (). The object () can be projected by the projection optics () onto the least one detector (), and the object () is simultaneously illuminated by both light sources (). In order to simultaneously detect bright field images and dark field images without involving complicated filtering operations, the light used for the dark field illumination is pulsed and the pulse intensity of the light used for the dark field illumination is greater by at least one order of magnitude than the intensity of the continuous light, which is used for the bright field illumination, during a pulsed interval.