The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2007

Filed:

Oct. 19, 2006
Applicants:

Masaru Kuribayashi, Akishima, JP;

Masahiro Nonoguchi, Tachikawa, JP;

Naohisa Osaka, Ome, JP;

Yoji Kobayashi, Akiruno, JP;

Inventors:

Masaru Kuribayashi, Akishima, JP;

Masahiro Nonoguchi, Tachikawa, JP;

Naohisa Osaka, Ome, JP;

Yoji Kobayashi, Akiruno, JP;

Assignee:

Rigaku Corporation, Akishima-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 1/15 (2006.01);
U.S. Cl.
CPC ...
Abstract

A filament for an X-ray tube has a varied wire diameter but has a constant coil outside diameter to obtain a good uniformity of the longitudinal temperature distribution of the filament. The filament has a wire diameter d which is gradually reduced from the longitudinal central region to the longitudinal ends while the coil outside diameter D is fixed along the longitudinal direction. The wire is polished at only the inside of the coil to reduce the wire diameter. In order to make the longitudinal temperature distribution uniform as far as possible, the difference Δd between the wire diameter dat the longitudinal central region and the wire diameter dat the longitudinal ends should satisfy the following limitation:Δ=0.041 to 0.145.


Find Patent Forward Citations

Loading…