The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
Jul. 09, 2004
Applicants:
Junichi Shimada, Osaka, JP;
Fumihiro Kimura, Nara, JP;
Mitsumi Ito, Kyoto, JP;
Kiyohito Mukai, Kyoto, JP;
Inventors:
Junichi Shimada, Osaka, JP;
Fumihiro Kimura, Nara, JP;
Mitsumi Ito, Kyoto, JP;
Kiyohito Mukai, Kyoto, JP;
Assignee:
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
Verification of the pattern area ratio of a semiconductor integrated circuit device or the pattern occupancy ratio in a check window set for the semiconductor integrated circuit device is performed on an assumption that a dummy pattern defined by process conditions is placed in an unoccupied region of the semiconductor integrated circuit device or in an unoccupied region in at least one instance provided in the semiconductor integrated circuit device.