The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2007
Filed:
May. 22, 2006
Sadayuki Matsumiya, Sagamihara, JP;
Hirato Sonobe, Miyazaki, JP;
Koichi Komatsu, Yamato, JP;
Mitutoyo Corporation, Kawasaki, JP;
Abstract
An image measuring method comprises making no stop of an imaging means relative to a measurement stage at measurement positions (MP-MP), and capturing instantaneous images to acquire information required for measurement. A first direction to a measurement position (MP) to be measured next and a second direction from the measurement position (MP) to a next measurement position (MP) form an angle therebetween. If this angle exceeds a certain angle, an overshoot path is formed at a location beyond the measurement position (MP) in the first direction. The larger the angle formed between the first direction and the second direction, the lower the measurement speed at the measurement position (MP) is made.