The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2007

Filed:

Nov. 21, 2001
Applicants:

Robert W. Parish, Gaston, OR (US);

Scott E. Zink, Portland, OR (US);

Evan Albright, Portland, OR (US);

Inventors:

Robert W. Parish, Gaston, OR (US);

Scott E. Zink, Portland, OR (US);

Evan Albright, Portland, OR (US);

Assignee:

Tektronix, Inc., Beaverton, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Image alias rejection when converting a high resolution rasterized waveform to a lower resolution rasterized waveform for display uses a statistical filter. The statistical filter provides a shaped probability density function either by combining the outputs of multiple random number generators, such as linear feedback shift registers, or by using a corresponding look-up table to produce a dither signal. The statistical filter may be applied to one or both of the dimensional values for each data point of the high resolution rasterized waveform by combining the dimensional values with the dither signal. The resulting filtered dimensional values may then be subsampled, such as by truncation, to produce values for a lower resolution rasterized waveform display.


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