The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Aug. 24, 2004
Blaine D. Johs, Lincoln, NE (US);
Ping He, Lincoln, NE (US);
Martin M. Liphardt, Lincoln, NE (US);
Christopher A. Goeden, Lincoln, NE (US);
John A. Woollam, Lincoln, NE (US);
James D. Welch, Omaha, NE (US);
Blaine D. Johs, Lincoln, NE (US);
Ping He, Lincoln, NE (US);
Martin M. Liphardt, Lincoln, NE (US);
Christopher A. Goeden, Lincoln, NE (US);
John A. Woollam, Lincoln, NE (US);
James D. Welch, Omaha, NE (US);
J.A. Woollam Co., Inc., Lincoln, NE (US);
Abstract
Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a beam of electromagnetic radiation to a surface of a sample system involving regression based methodology for evaluating and compensating the effects of the presence electromagnetic beam intercepting angle-of-incidence changing systems, including where desired, parameterization of calibration parameters.