The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2007
Filed:
Jul. 14, 2003
Shojiro Kawakami, Sendai, JP;
Takashi Sato, Sendai, JP;
Takayuki Kawashima, Sendai, JP;
Wataru Ishikawa, Shichigahama-machi, JP;
Shojiro Kawakami, Sendai, JP;
Takashi Sato, Sendai, JP;
Takayuki Kawashima, Sendai, JP;
Wataru Ishikawa, Shichigahama-machi, JP;
Autocloning Technology Ltd., Miyagi, JP;
Abstract
A thin polarizer array and a wavelength plate array that are composed of micro regions having different optical axis directions and wavelength characteristics and having a high extinction ratio and a low insertion loss, and a polarization analyzer using them. An array of micro periodic grooves is formed on a substrate, with the directions changed from one region to another. An alternating multilayer film formed by bias sputtering alternating a layer of high refractive index material such as Si or TaOand a layer of low refractive index material such as SiO. By selecting a condition that each layer maintains its periodic projecting/recessed shape, an array of photonic crystal polarizer is formed. By mounting this array of photonic crystal polarizer in a photodetector array, a polarization analyzer that is small, has no movable part, has a small number of components, and enables high-precision measurement is constituted.