The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7265818 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 04, 2007

Filed:

Dec. 27, 2004
Applicants:

Byong-cheol Park, Suwon-si, KR;

Dong-hwa Shin, Suwon-si, KR;

Seung-ki Chae, Soul, KR;

Sang-ho Lee, Suwon-si, KR;

Inventors:

Byong-Cheol Park, Suwon-si, KR;

Dong-Hwa Shin, Suwon-si, KR;

Seung-Ki Chae, Soul, KR;

Sang-Ho Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 27/32 (2006.01); G03B 27/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of exposing a wafer to a light comprises transferring an image onto a plurality of shot areas by irradiating a projection light, each of the plurality of shot areas including at least one die area defined on the wafer on which a photoresist film is formed, and scanning the at least one die area adjacent to an edge portion of the wafer by irradiating a scanning light.


Find Patent Forward Citations

Park, Byong-Cheol. (2007). Method of exposing a wafer to a light, and reticle, reticle assembly and exposing apparatus for performing the same (U.S. Patent No. 7265818). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7265818

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…