The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2007
Filed:
Apr. 09, 2003
Alexander Gyure, San Jose, CA (US);
Jindrich Zejda, Sunnyvale, CA (US);
Peivand Fallah-tehrani, Camarillo, CA (US);
Wenyuan Wang, Fremont, CA (US);
Chi-chong Lo, San Jose, CA (US);
Seyed Alireza Kasnavi, Sunnyvale, CA (US);
Mahmoud Shahram, Cupertino, CA (US);
Yansheng Luo, Fremont, CA (US);
William Chiu-ting Shu, Palo Alto, CA (US);
Alexander Gyure, San Jose, CA (US);
Jindrich Zejda, Sunnyvale, CA (US);
Peivand Fallah-Tehrani, Camarillo, CA (US);
Wenyuan Wang, Fremont, CA (US);
Chi-Chong Lo, San Jose, CA (US);
Seyed Alireza Kasnavi, Sunnyvale, CA (US);
Mahmoud Shahram, Cupertino, CA (US);
Yansheng Luo, Fremont, CA (US);
William Chiu-Ting Shu, Palo Alto, CA (US);
Synopsys, Inc., Mountain View, CA (US);
Abstract
One embodiment of the invention provides a system that analyzes the propagation of noise through an integrated circuit. During operation, the system obtains an input noise signal to be applied to a cell within the integrated circuit. The system then looks up parameters specifying how noise affects the cell, and then uses the parameters to determine how the input noise signal affects the cell. This can involve determining if the input noise signal will cause the cell to fail and/or determining a propagated noise signal that emanates from the cell.