The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2007

Filed:

Jun. 28, 2002
Applicants:

Akira Nishikawa, Tokyo, JP;

Naoki Sugiyama, Tokyo, JP;

Hiroomi Shimomura, Tokyo, JP;

Inventors:

Akira Nishikawa, Tokyo, JP;

Naoki Sugiyama, Tokyo, JP;

Hiroomi Shimomura, Tokyo, JP;

Assignee:

JSR Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B32B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An antireflection film laminate comprising a low refractive index film on the surface side and a high refractive index film which is disposed under the low refractive index film in contact therewith, wherein the high refractive index film is formed as a discontinuous layer in the planar direction. If the high refractive index film is formed as a discontinuous layer, the high refractive index film can enter into the low refractive index film to restrain movement of the low refractive index film, and therefore an antireflection film laminate exhibiting superior antiscratching property and transparency can be obtained.


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