The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Apr. 27, 2004
Robert J. Allen, Jericho, VT (US);
Michael S. Gray, Fairfax, VT (US);
Jason D. Hibbeler, Williston, VT (US);
Mervyn Yee-min Tan, South Burlington, VT (US);
Robert F. Walker, St. George, VT (US);
Robert J. Allen, Jericho, VT (US);
Michael S. Gray, Fairfax, VT (US);
Jason D. Hibbeler, Williston, VT (US);
Mervyn Yee-Min Tan, South Burlington, VT (US);
Robert F. Walker, St. George, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of calculating critical area in an integrated circuit design, said method comprising: inputting an integrated circuit design; associating variables with the positions of edges in said integrated circuit design; and associating cost functions of said variables with spacing between said edges in said integrated circuit design; wherein said cost functions calculate critical area contributions as the positions and length of said edges in said integrated circuit design change, and wherein said critical area contributions comprise a measure of electrical fault characteristics of said spacing between said edges in said integrated circuit design.