The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2007

Filed:

Jul. 02, 2003
Applicants:

Masaaki Inoo, Tokyo, JP;

Tomokazu Nakamura, Chiba, JP;

Yusuke Obuchi, Chiba, JP;

Yoshiyuki Nakajima, Ibaraki, JP;

Atsuteru Oikawa, Chiba, JP;

Hitoshi Kato, Ibaraki, JP;

Inventors:

Masaaki Inoo, Tokyo, JP;

Tomokazu Nakamura, Chiba, JP;

Yusuke Obuchi, Chiba, JP;

Yoshiyuki Nakajima, Ibaraki, JP;

Atsuteru Oikawa, Chiba, JP;

Hitoshi Kato, Ibaraki, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

An inspection device having a reading portion for reading an image on a sheet having an image formed thereon, a storage portion for storing therein image data read by the reading portion, and a selecting portion for selecting one of a first mode for storing the image data read by the reading portion in the storage portion, and a second mode for judging whether the image data read by the reading portion is similar to the image data stored in the storage portion.


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