The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2007
Filed:
Sep. 22, 2004
Joseph Marron, Pittsford, NY (US);
Nestor Farmiga, Rochester, NY (US);
Andrew W. Kulawiec, Fairport, NY (US);
Thomas J. Dunn, Penfield, NY (US);
Joseph Marron, Pittsford, NY (US);
Nestor Farmiga, Rochester, NY (US);
Andrew W. Kulawiec, Fairport, NY (US);
Thomas J. Dunn, Penfield, NY (US);
Corning Incorporated, Corning, NY (US);
Abstract
A mode-monitoring system used in connection with discrete beam frequency tunable laser provides optical feedback that can be used for adjusting the laser or for other processing associated with the use of the laser. For example, the output of a frequency tunable source for a frequency-shifting interferometer can be monitored to support the acquisition or processing of more accurate interference data. A first interferometer for taking desired measurements of optical path length differences traveled by different portions of a measuring beam can be linked to a second interferometer for taking measurements of the measuring beam itself. The additional interference data can be interpreted in accordance with the invention to provide measures of beam frequency and intensity.