The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Mar. 24, 2005
Applicants:
Chia-lin Cheng, Tao-Yuan, TW;
Ej Wu, Hsinchu, TW;
Shih-cheng Chang, Hsin-Chu, TW;
Kuo-yin Chen, Hsinchu, TW;
Inventors:
Chia-Lin Cheng, Tao-Yuan, TW;
EJ Wu, Hsinchu, TW;
Shih-Cheng Chang, Hsin-Chu, TW;
Kuo-Yin Chen, Hsinchu, TW;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for integrally checking a chip layout dataset and a package substrate layout dataset for errors are disclosed. The package substrate layout dataset is converted from a first format into a second format in which the chip layout dataset is provided. The chip layout dataset of the second format is combined with the package substrate layout dataset of the second format into a combined dataset. The combined dataset is then checked for errors or design rule violations.