The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2007
Filed:
Jun. 19, 2006
Applicants:
Hitesh Suri, San Jose, CA (US);
Cathy Kardach, Saratoga, CA (US);
Inventors:
Hitesh Suri, San Jose, CA (US);
Cathy Kardach, Saratoga, CA (US);
Assignee:
Credence Systems Corporation, Milpitas, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method for tracing back a probing location to identify the circuit element being probed on a device under test (DUT). The coordinates of the irregularity on the DUT are used to trace back to the logic cone to decipher the root-cause of the irregularity. The Def and Lef files are interrogated using the coordinates to obtain the cell and net data to enable the investigation. Additionally, a schematic viewer is used to investigate the logic cone to potential root-causes for the irregularities.