The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 07, 2007
Filed:
Nov. 17, 2003
Qi Zhao, Ossining, NY (US);
Chunhe Gong, Niskayuna, NY (US);
Bruno DE Man, Clifton Park, NY (US);
Samit Kumar Basu, Niskayuna, NY (US);
Fracis Howard Little, Cincinnati, OH (US);
Qi Zhao, Ossining, NY (US);
Chunhe Gong, Niskayuna, NY (US);
Bruno De Man, Clifton Park, NY (US);
Samit Kumar Basu, Niskayuna, NY (US);
Fracis Howard Little, Cincinnati, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A computed tomography (CT) reconstruction method includes implementing an iterative image reconstruction process for CT metrology of an object, wherein the iterative reconstruction process utilizes accurate forward projection. During each of a plurality of iterations, a reconstructed image is constrained by utilizing prior outer edge information obtained from a modality in addition to CT, and then transformed to a projection domain so as to generate a calculated sinogram. A correction image is determined based on the calculated sinogram and a measured sinogram.