The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 31, 2007
Filed:
May. 23, 2005
Koichi Oka, Otsu, JP;
Satoshi Nitta, Kameoka, JP;
Koichi Oka, Otsu, JP;
Satoshi Nitta, Kameoka, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
An inventive optical cell measurement apparatus comprises a light source (S) which emits light having a predetermined wavelength range, a first mirror (M) which reflects the light emitted from the light source (S), a long light path gas cell () to which the light reflected on the first mirror (M) is introduced, a second mirror (M) which reflects light outputted from the long light path gas cell (), a sensor (D) which detects the light reflected on the second mirror (M), and optical elements () disposed in a light path extending from the light source (S) to the sensor (D) and each having a bifocal property with different focal lengths as measured in two directions (X, Y) perpendicular to the light path. With this arrangement, the aberration of spherical mirrors () disposed in the gas cell () is corrected, thereby preventing reduction of the transmittance of the gas cell ().