The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 24, 2007

Filed:

Mar. 25, 2004
Applicants:

Masaya Muranaka, Akishima, JP;

Hideaki Kato, Ome, JP;

Yutaka Ito, Ome, JP;

Inventors:

Masaya Muranaka, Akishima, JP;

Hideaki Kato, Ome, JP;

Yutaka Ito, Ome, JP;

Assignee:

Elpida Memory, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An error rate select circuit activated in an information sustaining mode is provided, wherein a plurality of pieces of data are read from a dynamic memory circuit and inspection bits which are used to detect an error existing in the pieces of data are generated. If no error is detected, a first predetermined value is added to a total value. If an error is detected, a second predetermined value greater than the first predetermined value is subtracted from the total value. If the total value exceeds a first set value, a refresh period is lengthened by a predetermined time increment. If the total value becomes smaller than a second set value, the refresh period is shortened by the predetermined time increment.


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