The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 24, 2007
Filed:
Mar. 01, 2004
Eric Chen-li Sheng, San Jose, CA (US);
David H. Hoffman, Sunnyvale, CA (US);
John Laurence Niven, Livermore, CA (US);
Eric Chen-Li Sheng, San Jose, CA (US);
David H. Hoffman, Sunnyvale, CA (US);
John Laurence Niven, Livermore, CA (US);
Transmeta Corporation, Santa Clara, CA (US);
Abstract
Systems and methods for reducing temperature variation during burn-in testing. In one embodiment, power consumed by an integrated circuit under test is measured. An ambient temperature associated with the integrated circuit is measured. A desired junction temperature of the integrated circuit is achieved by adjusting a body bias voltage of the integrated circuit. By controlling temperature of individual integrated circuits, temperature variation during burn-in testing can be reduced.