The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 10, 2007

Filed:

May. 23, 2005
Applicants:

Eric Chen-li Sheng, San Jose, CA (US);

David H. Hoffman, Sunnyvale, CA (US);

John Laurence Niven, Livermore, CA (US);

Inventors:

Eric Chen-Li Sheng, San Jose, CA (US);

David H. Hoffman, Sunnyvale, CA (US);

John Laurence Niven, Livermore, CA (US);

Assignee:

Transmeta Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for reducing temperature dissipation during burn-in testing are described. A plurality of devices under test are each subject to a body bias voltage. The body bias voltage reduces leakage current associated with the devices under test. Accordingly, heat dissipation is reduced during burn-in. The body bias voltage is selected to achieve a desired junction temperature at the devices under test.


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