The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2007
Filed:
Jan. 11, 2005
Applicants:
Akikazu Odawara, Chiba, JP;
Satoshi Nakayama, Chiba, JP;
Keiichi Tanaka, Chiba, JP;
Inventors:
Assignee:
SII NanoTechnology Inc., , JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 27/18 (2006.01); H01L 39/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A superconducting X-ray detection apparatus has a refrigerator, a cooling head cooled by the refrigerator, and a stacked structure connected to an end portion of the cooling head. The stacked structure comprises a sensor holder, a low-temperature first-stage amplifier connected to the sensor holder, and a superconducting X-ray detector mounted on the low-temperature first-stage amplifier.
Odawara, Akikazu. (2007). Superconducting x-ray detection apparatus and superconducting x-ray analyzer using the apparatus (U.S. Patent No. 7241997). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7241997
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile