The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 03, 2007
Filed:
Aug. 23, 2004
Wu-tung Cheng, Lake Oswego, OR (US);
Kun-han Tsai, Lake Oswego, OR (US);
Yu Huang, Marlborough, MA (US);
Nagesh Tamarapalli, Wilsonville, OR (US);
Janusz Rajski, West Linn, OR (US);
Wu-Tung Cheng, Lake Oswego, OR (US);
Kun-Han Tsai, Lake Oswego, OR (US);
Yu Huang, Marlborough, MA (US);
Nagesh Tamarapalli, Wilsonville, OR (US);
Janusz Rajski, West Linn, OR (US);
Other;
Abstract
Methods, apparatus, and systems for performing fault diagnosis are disclosed herein. In certain disclosed embodiments, methods for diagnosing faults from compressed test responses are provided. For example, in one exemplary embodiment, a circuit description of an at least partially scan-based circuit-under-test and a compactor for compacting test responses captured in the circuit-under-test is received. A transformation function performed by the compactor to the test responses captured in the circuit-under-test is determined. A diagnostic procedure for evaluating uncompressed test responses is modified into a modified diagnostic procedure that incorporates the transformation function therein. Computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Likewise, computer-readable media comprising lists of fault candidates identified by any of the disclosed methods or circuit descriptions created or modified by the disclosed methods are provided.