The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 26, 2007
Filed:
Feb. 06, 2004
Kenji Inaba, Tokyo, JP;
Masashi Miyazaki, Tokyo, JP;
Kenji Inaba, Tokyo, JP;
Masashi Miyazaki, Tokyo, JP;
Advantest Corporation, Tokyo, JP;
Abstract
A testing apparatus including a plurality of testing module slots to which different types of testing modules for testing a device under test are optionally mounted, includes a first and a second testing modules, and a synchronization controlling unit. The synchronization controlling unit includes an operation order holding unit for holding information indicating that a test operation by a first testing module should be performed before a test operation by a second testing module, a trigger return signal receiving unit for receiving a trigger return signal from the first testing module, and a trigger signal supplying unit for supplying a trigger signal to the second testing module, the trigger signal indicating that the second testing module should start the test operation thereof, when the trigger return signal receiving unit receives the trigger return signal.